Registration Dossier
Registration Dossier
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EC number: 231-545-4 | CAS number: 7631-86-9
Nanomaterial dustiness
Administrative data
- Endpoint:
- nanomaterial dustiness
- Type of information:
- experimental study
- Adequacy of study:
- key study
- Reliability:
- 1 (reliable without restriction)
- Rationale for reliability incl. deficiencies:
- test procedure in accordance with generally accepted scientific standards and described in sufficient detail
Data source
Reference
- Reference Type:
- study report
- Title:
- Unnamed
- Year:
- 2 017
- Report date:
- 2017
Materials and methods
Test guideline
- Qualifier:
- according to guideline
- Guideline:
- other: SOP EM-002 / LM-EM-004
- GLP compliance:
- yes
- Other quality assurance:
- ISO/IEC 17025 (General requirements for the competence of testing and calibration laboratories)
- Type of method:
- other: TEM / TGB
- Details on methods and data evaluation:
- TEM pictures of test item were analysed statistically according AGB method.
Test material
- Reference substance name:
- Silicon dioxide
- EC Number:
- 231-545-4
- EC Name:
- Silicon dioxide
- Cas Number:
- 7631-86-9
- Molecular formula:
- O2Si
- IUPAC Name:
- dioxosilane
- Test material form:
- solid: nanoform
Constituent 1
- Specific details on test material used for the study:
- Kieselsäure
Syloid® 72 1000251982 11/13
Results and discussion
Dustiness index
- Remarks on result:
- not measured/tested
Applicant's summary and conclusion
- Conclusions:
- Total number of counted particles N: 2018
Primary particle diameter, arithmetical average DN: 6,374 nm
Primary particle diameter, averaged over the surface DA: 6,912 nm
Primary particle diameter, averaged by volume DV: 7,212 nm
Primary particle diameter, standard deviation S: 1,283 nm
Primary particle diameter, variation coefficient V: 20,137
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